Monday, August 11, 2014
Sunday, June 1, 2014
AS-2011 Laser Particle Size Analyzer
Overview
AS-2011 Laser Particle Size Analyzer works with principle of Mie Scattering to precisely determine the particle size distribution from 0.1 to 500 micrometer. This equipment has a few advantages all its own. Robust laser diode and innovative photocells optimize the precision of static light scattering and give AS-2011 a longer operational lifetime. Patented optical bench uproots light path deviation, one of the major technical problems in the industry of particle size analysis. User-friendly program and advanced algorism bring accuracy and repeatability qualification to International Standard ISO13320-1 Particle Size Analysis – Laser Diffraction Methods. Laser particle size analyzer price is usually expensive however AS-2011 has become the most reliable and cost-effective laser diffraction particle size analyser being widely used in Particle Characterization.
AS-2011 Laser Particle Size Analyzer works with principle of Mie Scattering to precisely determine the particle size distribution from 0.1 to 500 micrometer. This equipment has a few advantages all its own. Robust laser diode and innovative photocells optimize the precision of static light scattering and give AS-2011 a longer operational lifetime. Patented optical bench uproots light path deviation, one of the major technical problems in the industry of particle size analysis. User-friendly program and advanced algorism bring accuracy and repeatability qualification to International Standard ISO13320-1 Particle Size Analysis – Laser Diffraction Methods. Laser particle size analyzer price is usually expensive however AS-2011 has become the most reliable and cost-effective laser diffraction particle size analyser being widely used in Particle Characterization.
as-2011-laser-particle-size-analyzer
Specifications
Measurement Principle: Mie Scattering Theory/Laser Diffraction Principle
Size Range: 0.1-500 um ( particle size D50, D03, D06, D10, D16, D25, D75, D84, D90, D97, D98 etc. )
Repeatability: <1% (Certified Reference Material SB2005 D50)
Accuracy: <1% (Certified Reference Material SB2005 D50)
Light Source: Semiconductor Laser Diode（life time more than 25000 hrs）
Measurement Time: <60 seconds (Sample preparation time is not included)
Power: 220V 50Hz 80W(Power converter 110V-220V is availabe as per specific requirement)
Data Connection: RS-232
Operating Systems: Windows XP/ Windows 7
ISO Norms: ISO 13320
Measurement Principle: Mie Scattering Theory/Laser Diffraction Principle
Size Range: 0.1-500 um ( particle size D50, D03, D06, D10, D16, D25, D75, D84, D90, D97, D98 etc. )
Repeatability: <1% (Certified Reference Material SB2005 D50)
Accuracy: <1% (Certified Reference Material SB2005 D50)
Light Source: Semiconductor Laser Diode（life time more than 25000 hrs）
Measurement Time: <60 seconds (Sample preparation time is not included)
Power: 220V 50Hz 80W(Power converter 110V-220V is availabe as per specific requirement)
Data Connection: RS-232
Operating Systems: Windows XP/ Windows 7
ISO Norms: ISO 13320
Friday, February 21, 2014
Wednesday, February 19, 2014
Tuesday, May 14, 2013
X-ray flaw detector is a type of flaw detectors using an X -ray beam generated from an X -ray tube penertrating the illuminated specimen to detect the flaws in the materials. There are two types of x-ray flaw detectors as below:
• Portable x-ray Flaw Detector
- HMK-AL1
- HMK-AL2
- HMK-AL3
- HMK-AL4
- HMK-AL5
• Mobile x-ray Flaw Detector
- HMK-AL6
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